Elimination method of overexposed areas in speckle pattern interferometry

Shuangle Wu; Yanfeng Yao; Xiangwei Liu; Huanqing Wang; Yonghong Wang; Peizheng Yan

doi:10.1117/12.2611962

19 November 2021 Elimination method of overexposed areas in speckle pattern interferometry

Shuangle Wu, Yanfeng Yao, Xiangwei Liu, Huanqing Wang, Yonghong Wang, Peizheng Yan

Proceedings Volume 12059, Tenth International Symposium on Precision Mechanical Measurements; 120590S (2021) https://doi.org/10.1117/12.2611962
Event: Tenth International Symposium on Precision Mechanical Measurements, 2021, Qingdao, China

Abstract

In the practical application of speckle pattern interference, it is often necessary to measure the deformation or defects of some specimens placed in the box. Transparent glass observation windows are usually used on one side of these boxes. In the measurement of laser speckle pattern interference, glass windows often cause overexposure in a certain area of the field of view, which has a great influence on the measurement. In this paper, a method of recognizing and eliminating high reflective region based on polaroid is proposed. By adjusting the polaroid to filter the stray and chaotic obtrusive light, the overexposed area in the field of view is greatly reduced, and then the exposure area caused by glass windows in the field of view is identified and extracted by feature extraction technology. Finally, the overexposed area is interpolated and filled according to the surrounding region information to obtain the measurement map without overexposure. Experimental results show that the proposed method can effectively extract and eliminate the overexposed area, and good measurement results are obtained.

Citation Download Citation

Shuangle Wu, Yanfeng Yao, Xiangwei Liu, Huanqing Wang, Yonghong Wang, and Peizheng Yan "Elimination method of overexposed areas in speckle pattern interferometry", Proc. SPIE 12059, Tenth International Symposium on Precision Mechanical Measurements, 120590S (19 November 2021); https://doi.org/10.1117/12.2611962

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