Laser-induced damage threshold analysis of high-purity silica fiber based on thermal effects

Yingshi Hu; Yingjie Chen; Baonan Jia; Xiaoning Guan; Yongpan Gao; Pengfei Lu

doi:10.1117/12.2624667

27 March 2022 Laser-induced damage threshold analysis of high-purity silica fiber based on thermal effects

Yingshi Hu, Yingjie Chen, Baonan Jia, Xiaoning Guan, Yongpan Gao, Pengfei Lu

Proceedings Volume 12169, Eighth Symposium on Novel Photoelectronic Detection Technology and Applications; 1216961 (2022) https://doi.org/10.1117/12.2624667
Event: Eighth Symposium on Novel Photoelectronic Detection Technology and Applications, 2021, Kunming, China

Abstract

Laser-induced damage threshold (LIDT) is the key parameter in the transmission of high power laser. Research on LIDT can help us to determine the scope of use of optical devices and thereby optimize the performance. We use the finite element method (FEM) to study the LIDT of high-purity silica fiber with 1064 nm laser. We find that the results of temperature distribution calculated by ray optics and wave optics show similar tendency. With the increase of laser fluences through the incident surface, the thermal effects become higher and laser damage gradually appears at the surface. We calculate the temperature and thermal stress displacements distribution when the laser fluences surpass LIDT. Our research can provide systematic FEM simulations for the LIDT of fibers.

Citation Download Citation

Yingshi Hu, Yingjie Chen, Baonan Jia, Xiaoning Guan, Yongpan Gao, and Pengfei Lu "Laser-induced damage threshold analysis of high-purity silica fiber based on thermal effects", Proc. SPIE 12169, Eighth Symposium on Novel Photoelectronic Detection Technology and Applications, 1216961 (27 March 2022); https://doi.org/10.1117/12.2624667

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