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Author(s), “Title of Paper,” in 2021 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, edited by Jigui Zhu, Lijiang Zeng, Jie Jiang,

Sen Han, Proc. of SPIE 12282, Seven-digit Article CID Number (DD/MM/YYYY); (DOI URL).

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510655690

ISBN: 9781510655706 (electronic)

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Symposium Committee

Conference Committee

Introduction

With the deepening and intensification of the informatization, a wider range of information sources and acquisition methods have become the basis for social and economic development. Because of its wide range, high efficiency and high precision, optoelectronic measurement technology has become the main means of information sensing and acquisition. It has been and will continue to play an important role in important fields such as scientific research, industrial manufacturing, environmental protection and consumer electronics.

The optoelectronic measurement covers a rich content, including lots of areas from scientific research, manufacturing industry to our daily life, the scope will to be expanded continuously and the content to be more and more deep going. On one hand, the traditional optoelectronic measurement research represented by the background of visual measurement and industrial detection have been constantly improved further, and the concerned performances have been constantly improved as well. On the other hand, the needs of optoelectronic measurement represented by optical interferometry and spectral measurement have been emerged ceaselessly, as well as the measuring methods and applications have been developed.

More than 70 papers have been accepted (including 3 invited presentations and 24 oral presentations) in this branch of OIT2021, ranging many research fields including optical interferometry, optical instrument development, environment detection, measuring performance evaluation, etc. These papers appropriately reflect the current focusing problems and research quality of the optoelectronic measurement technology.

Jigui Zhu

Lijiang Zeng

Jie Jiang

Sen Han

Organizers

Opto-Electronic Mechanic Technology and System Integration Chapter, CIS (China)

Committee on Optoelectronic Technology, COS (China)

Committee on Optics, China Ordnance Society (China)

Optical Instrument Chapter, CIS (China)

Beijing Institute of Technology (China)

Tianjin University (China)

Tsinghua University (China)

Peking University (China)

Nanjing University (China)

Zhejiang University (China)

Sichuan University (China)

Nankai University (China)

Capital Normal University (China)

Beijing University of Posts and Telecommunications (China)

Beihang University (China)

Chongqing University (China)

University of Shanghai for Science and Technology (China)

Instrument Society of America (United States)

Institute of Measurement and Control (United Kingdom)

Hong Kong Institution of Engineers (Hong Kong, China)

The Society of Measurement and Control (Japan)