A computerized photoelectric refractometer

Baoyong Mi

doi:10.1117/12.2294704

1 July 1990 A computerized photoelectric refractometer

Baoyong Mi

Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 12301V (1990) https://doi.org/10.1117/12.2294704
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States

Abstract

This paper describes design idea of a computerized photoelectric refractometer and its construction and discusses the sources of error. The refracti',ve indices _of optical glasses are measured with this instrument. The measuring uncertainties of 3x10 and 3x10 in the wavelength ranges of 300 to 2800 nm and 2800 to 12000 nm are obtained, respectively.

Citation Download Citation

Baoyong Mi "A computerized photoelectric refractometer", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12301V (1 July 1990); https://doi.org/10.1117/12.2294704

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available