Absolute distance measurement based on laser self-mixing interferometry and deep neural network

Jinyuan Yuan; Yangfan Jiang; Bin Liu

doi:10.1117/12.2642051

27 December 2022 Absolute distance measurement based on laser self-mixing interferometry and deep neural network

Jinyuan Yuan, Yangfan Jiang, Bin Liu

Proceedings Volume 12311, Semiconductor Lasers and Applications XII; 1231104 (2022) https://doi.org/10.1117/12.2642051
Event: SPIE/COS Photonics Asia, 2022, Online Only

Abstract

Self-mixing interferometry (SMI) is superior to other laser interferometry methods due to its simplicity and compactness. However, SMI signals are often complex and difficult to process due to interference in the form of variations in the effective reflectivity of the target, noisy signals, complex signal shapes, and other dependencies. Deep neural networks have been a very popular area of research in computer artificial intelligence in recent years, allowing more implicit features to be uncovered than traditional shallow machine learning. It has been shown that convolutional and back-propagation neural networks can be used for SMI signal processing. There are also studies that have used machine learning genetic algorithms for absolute distance measurement. Based on the above, this study used convolutional neural networks to form a deep neural network for absolute distance measurement based on SMI technology. We first trained the deep convolutional neural network at different feedback strengths. The results of the Convolutional Neural Network (CNN) model showed a coefficient of determination of 0.9987. which is consistent with the required model. The trained network was then used to estimate absolute distances with and without the addition of noise. The comparison proves that the proposed method is noise-proof and has high adaptability for measurements under different conditions.

Conference Presentation

Citation Download Citation

Jinyuan Yuan, Yangfan Jiang, and Bin Liu "Absolute distance measurement based on laser self-mixing interferometry and deep neural network", Proc. SPIE 12311, Semiconductor Lasers and Applications XII, 1231104 (27 December 2022); https://doi.org/10.1117/12.2642051

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