Fourier ptychographic microscopy (FPM) is a new quantitative phase imaging (QPI) method, which achieves highresolution and wide-field-of-view imaging by iterative reconstruction algorithm. However, its drawbacks are long acquisition time and large data set, not only a large number of images need to be taken for each reconstruction, but also long exposure time is required for dark field images. To alleviate this problem, we propose an efficiency-optimized Fourier ptychographic microscopy based on spectrum overlap percentage analysis. By adopting illumination-optimized DPC and centrosymmetric sparse illumination, the number of acquired images is reduced several times, improving the imaging efficiency of FPM. This approach promises potential for high-throughput phasing applications.
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