Silicon photonics packaging using engineered scattering elements

Tyler V. Howard; Thomas G. Brown

doi:10.1117/12.2651278

13 March 2023 Silicon photonics packaging using engineered scattering elements

Tyler V. Howard, Thomas G. Brown

Proceedings Volume 12426, Silicon Photonics XVIII; 1242605 (2023) https://doi.org/10.1117/12.2651278
Event: SPIE OPTO, 2023, San Francisco, California, United States

Abstract

Accurate monitoring of the polarization within a waveguide is key to verifying the polarization fidelity in photonic integrated circuits and in verifying polarization during fiber alignment. Current testing methods require either a combined input/output fiber attachment or a tap/detector combination. These measure the coupled power but cannot monitor the polarization state near individual components. We have designed and tested foundry-compatible optical test-points for polarization monitoring. We study scatterers both for SiN and Si waveguides fabricated in the AIM Photonics foundry. We observe strong polarization effects in the light scattered from these elements when designed in certain geometries. When viewed with a short-wave infrared microscope, captured images displayed extinction values up to 30x between orthogonal polarizations for the engineered scattering elements. Finite-difference time-domain simulations were performed for each scattering element, corroborating experimental measurements but showing that even higher extinctions may be possible with further refinement.

Conference Presentation

Citation Download Citation

Tyler V. Howard and Thomas G. Brown "Silicon photonics packaging using engineered scattering elements", Proc. SPIE 12426, Silicon Photonics XVIII, 1242605 (13 March 2023); https://doi.org/10.1117/12.2651278

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