Robert A. Jones,1 Steven Allen,1 Daniel Chmielewski,1 Kedar Manandhar,1 Rudy Fink,1 Biswanath Roy,1 Daniel Jardine,1 Nansheng Tang,1 Loucas Tsakalakos,1 Lee Elizondo1
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The increased performance and versatility of epitaxially grown III-V Type II strained layer superlattice (T2SLS) materials led to disruption of the IR sensor industry over the last decade. Increased performance at reduced cost are highly attractive to many end customers. Access to this detector material combined with the L3Harris front-side illuminated FPA structure lend to mechanically robust FPAs with array size only limited by source detector wafer size. This paper will present an overview of the technology development at L3Harris and the progress that has been made introducing SLS material into high operating temperature (HOT) MWIR sensors, LWIR sensors and dual-band (MW/MW & MW/LW) sensors.
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Robert A. Jones, Steven Allen, Daniel Chmielewski, Kedar Manandhar, Rudy Fink, Biswanath Roy, Daniel Jardine, Nansheng Tang, Loucas Tsakalakos, Lee Elizondo, "Advancements in strained layer superlattice-based infrared focal plane arrays at L3Harris," Proc. SPIE 12534, Infrared Technology and Applications XLIX, 125340G (15 June 2023); https://doi.org/10.1117/12.2663921