Single event effect evaluation of different communication ways based on 40nm SRAM-FPGA

Xu Zhao; Xuecheng Du; Xu Xiong; Zhi Chen; Wei Jiang

doi:10.1117/12.2671259

28 April 2023 Single event effect evaluation of different communication ways based on 40nm SRAM-FPGA

Xu Zhao, Xuecheng Du, Xu Xiong, Zhi Chen, Wei Jiang

Proceedings Volume 12610, Third International Conference on Artificial Intelligence and Computer Engineering (ICAICE 2022); 126100M (2023) https://doi.org/10.1117/12.2671259
Event: Third International Conference on Artificial Intelligence and Computer Engineering (ICAICE 2022), 2022, Wuhan, China

Abstract

Field-Programmable Gate Array (FPGA) is now considered by an increasing number of designers in various fields of application, such as space and aircraft embedded control systems, image and signal processing. It is a popular way to design different serial communication protocols including serial and network communications implemented by FPGA, which ensure data transfer accuracy and timing. However, Single Event Effects (SEE) can pose a serious threat to the reliability of FPGA in the radiation environments. In order to evaluate the reliability and failure modes of different communication interfaces in radiation environments, three communication protocols were tested by alpha radiation source, including Universal Asynchronous Receiver Transmitter (UART), ethernet, and Universal Serial Bus (USB). The experiments have presented the failure modes and SEE cross sections to different communication ways.

Citation Download Citation

Xu Zhao, Xuecheng Du, Xu Xiong, Zhi Chen, and Wei Jiang "Single event effect evaluation of different communication ways based on 40nm SRAM-FPGA", Proc. SPIE 12610, Third International Conference on Artificial Intelligence and Computer Engineering (ICAICE 2022), 126100M (28 April 2023); https://doi.org/10.1117/12.2671259

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