Paper
7 September 2023 Factors affecting compensated capacitor faults based on nonparametric test methods
Xiaoxu Fan, Wenzhen Kuang
Author Affiliations +
Proceedings Volume 12790, Eighth International Conference on Electromechanical Control Technology and Transportation (ICECTT 2023); 127901Y (2023) https://doi.org/10.1117/12.2690022
Event: 8th International Conference on Electromechanical Control Technology and Transportation (ICECTT 2023), 2023, Hangzhou, China
Abstract
Uninsulated track circuits are a key part of the train operation control system, and in uninsulated track circuits, compensation capacitor faults lead to reduced transmission distances due to increased transmission decay[1].In this paper, the sample nonparametric test method is used to analyze the difference of the compensating capacitor fault samples according to the different carrier frequencies, and the influence of different carrier frequencies on the compensating capacitor faults is excluded. On this basis, the spatiotemporal distribution of the fault capacitor is analyzed, and the main factors affecting the fault of the compensated capacitor are identified.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaoxu Fan and Wenzhen Kuang "Factors affecting compensated capacitor faults based on nonparametric test methods", Proc. SPIE 12790, Eighth International Conference on Electromechanical Control Technology and Transportation (ICECTT 2023), 127901Y (7 September 2023); https://doi.org/10.1117/12.2690022
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Capacitors

Failure analysis

Statistical analysis

Automation

Electrical breakdown

Statistical methods

Optical properties

Back to Top