Poster + Paper
13 March 2024 OLED lifetime simulation for VR displays
Andrew Dunton, Donghee Nam, Jacob Choi, T. Scott Murdison, Jim Zhuang
Author Affiliations +
Proceedings Volume 12908, Advances in Display Technologies XIV; 129080F (2024) https://doi.org/10.1117/12.3004214
Event: SPIE OPTO, 2024, San Francisco, California, United States
Conference Poster
Abstract
This paper introduces a new methodology for simulating the burn-in of an organic light-emitting diode (OLED) microdisplay used in a virtual reality (VR) headset. The proposed simulation employs the stretched exponential decay (SED) model, which is widely used to predict the degradation of the OLED device over time. Furthermore, the model integrates the impact of user head motion on VR display image content. The study defines productivity and gaming mode surrogate image content from which to simulate burn-in and applies image processing correlating to head motion data collected from a user study. The results of this study indicate that head motion has a significant impact on OLED burn-in. Given a conservative assumption for image content and head motion, the time for visual failure due to burn-in artifacts is 4 times slower than a case with stationary image content.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Andrew Dunton, Donghee Nam, Jacob Choi, T. Scott Murdison, and Jim Zhuang "OLED lifetime simulation for VR displays", Proc. SPIE 12908, Advances in Display Technologies XIV, 129080F (13 March 2024); https://doi.org/10.1117/12.3004214
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KEYWORDS
Head

Virtual reality

Organic light emitting diodes

Visualization

Data modeling

Image processing

Surface conduction electron emitter displays

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