Due to its cost-effectiveness and semiconductive properties, single-crystal Si is a promising photon-counting detector for CT imaging. However, its low Z value causes significant X-ray scattering, affecting resolution and efficiency. High Z metal foils, introduced to absorb these scattered X-rays, reduce detectable photon percentages and radiation dose efficiency. We introduce a hybrid edge-on detector design replacing metal foils with high Z scintillators and Si-based thin-film photodiodes. Our experiments, using a prototype of paired Si and scintillator, demonstrate that scattered X-rays induce scintillation detectable by photodiodes, offering enhanced dose efficiency and signal detection from scintillator layers.
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