Presentation
3 April 2024 Recycling scattered X-rays within edge-on Si photon counting detectors via Si-scintillator lamination
Christian De Caro, Guang-Hong Chen, Ke Li
Author Affiliations +
Abstract
Due to its cost-effectiveness and semiconductive properties, single-crystal Si is a promising photon-counting detector for CT imaging. However, its low Z value causes significant X-ray scattering, affecting resolution and efficiency. High Z metal foils, introduced to absorb these scattered X-rays, reduce detectable photon percentages and radiation dose efficiency. We introduce a hybrid edge-on detector design replacing metal foils with high Z scintillators and Si-based thin-film photodiodes. Our experiments, using a prototype of paired Si and scintillator, demonstrate that scattered X-rays induce scintillation detectable by photodiodes, offering enhanced dose efficiency and signal detection from scintillator layers.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Christian De Caro, Guang-Hong Chen, and Ke Li "Recycling scattered X-rays within edge-on Si photon counting detectors via Si-scintillator lamination", Proc. SPIE 12925, Medical Imaging 2024: Physics of Medical Imaging, 129250D (3 April 2024); https://doi.org/10.1117/12.3008619
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KEYWORDS
Silicon

X-rays

X-ray detectors

Scintillators

Photon counting

Metals

Photodiodes

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