Limits of optical and electrical fan-out versus power and fan-out versus bandwidth

Tie Wang; Raymond Arrathoon

doi:10.1117/12.21307

1 September 1990 Limits of optical and electrical fan-out versus power and fan-out versus bandwidth

Tie Wang, Raymond Arrathoon

Proceedings Volume 1297, Hybrid Image and Signal Processing II; (1990) https://doi.org/10.1117/12.21307
Event: 1990 Technical Symposium on Optics, Electro-Optics, and Sensors, 1990, Orlando, FL, United States

Abstract

The present comparative study of fundamental differences between electrical and optical interconnects proceeds from an analysis based on Maxwell''s equations. Attention is given to the combinational properties of the electrical interconnects for N gates, within the constraints of microelectronics technology. A gate-level comparison is conducted between electronic and optoelectronic fan-out vs switching time and fan-out vs power. Signal distortion, electromigration, and thermal transfer problems are associated with interconnect fan-out; in general, smaller feature sizes lead to greater electromigration effects than signal distortion effects at all frequencies.

Citation Download Citation

Tie Wang and Raymond Arrathoon "Limits of optical and electrical fan-out versus power and fan-out versus bandwidth", Proc. SPIE 1297, Hybrid Image and Signal Processing II, (1 September 1990); https://doi.org/10.1117/12.21307

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