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The amount of end-of-life photovoltaic modules will increase significantly in the upcoming years. In order to enable a high-quality recycling process, innovative approaches to separate the module laminates layer by layer are required. In this work we use a combination of near-infrared spectroscopy (NIRS) and optical coherence tomography (OCT) to characterize the identity and dimensions of the individual layers within the multi-material composite of a PV module, especially the backsheet. NIRS is used to identify the polymer material types, while OCT measures the respective thickness of the layer. First results show that the combination of both techniques enables a precise qualitative and quantitative description of the layers of a PV module that can be used as an input for subsequent separation and recycling processes.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Martin De Biasio,Anika Gassner,Gabriele C. Eder, andLukas Neumaier
"Non-destructive thickness measurement of the individual layers of end-of-life photovoltaic modules to enable optimized layer separation", Proc. SPIE 13026, Next-Generation Spectroscopic Technologies XVI, 130260K (7 June 2024); https://doi.org/10.1117/12.3011131
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Martin De Biasio, Anika Gassner, Gabriele C. Eder, Lukas Neumaier, "Non-destructive thickness measurement of the individual layers of end-of-life photovoltaic modules to enable optimized layer separation," Proc. SPIE 13026, Next-Generation Spectroscopic Technologies XVI, 130260K (7 June 2024); https://doi.org/10.1117/12.3011131