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The monitoring of mechanical strain is essential in developing new materials, designing mechanical components and structural health monitoring. In applications where contactless measurement is required, a novel method is needed to allow for absolute and long-term measurements. We discuss a measuring principle based on diffractive nanostructures featuring these advantages. For the measurement, periodic nanostructures are applied to a component, illuminated with a defined light source and the resulting color impression is monitored. The relationship between the stretched geometry of the nanostructure and diffraction spectra allows to quantify the component’s strain. We present a guideline for the design of industrial applicable and sensitivity-optimized nanostructures and discuss the advantages in different application scenarios.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Andreas Ulm,Niels König, andRobert Schmitt
"A concept for a large-scale non-contact strain measurement system using nanostructures", Proc. SPIE 13083, SPIE Future Sensing Technologies 2024, 1308311 (28 May 2024); https://doi.org/10.1117/12.3022608
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Andreas Ulm, Niels König, Robert Schmitt, "A concept for a large-scale non-contact strain measurement system using nanostructures," Proc. SPIE 13083, SPIE Future Sensing Technologies 2024, 1308311 (28 May 2024); https://doi.org/10.1117/12.3022608