Augmented and virtual reality displays require the use of thin liquid crystal cells, with thickness of the order of 1-2 µm. Here, we demonstrate a method, based on cross-polarised intensity measurements coupled to a Frank-Oseen model of the liquid crystal alignment, to characterise such thin cells and the interactions between the liquid crystal and the cell substrates. We first use wedge shaped cells to calibrate the measurement process and show that the cross-polarised intensity data can be used to reliably characterise cells with a non-uniform thickness profile. Previously, we have shown that we can characterise optically thin cells (cells with a phase lag of less than 2π). In this report we apply the method to characterise the optical properties of cells with a non-uniform thickness profile and geometrically thin cells. We show that reducing the thickness of the cell increases the pretilt.
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