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7 January 2025 Performance of plane wavefront Fizeau interferometers in power spectral density measurements with tilted plane optics (Erratum)
V. V. Yashchuk, K. Munechika, S. Rochester, P. Z. Takacs, I. Lacey, K. Yamada
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Proceedings Volume 13150, Advances in X-Ray/EUV Optics and Components XIX; 131500E (2025) https://doi.org/10.1117/12.3060512
Event: Optical Engineering + Applications, 2024, San Diego, California, United States
Abstract
Publisher's Note: This paper, originally published on 4 October 2024, was replaced with a corrected/revised version on 7 January 2025. If you downloaded the original PDF but are unable to access the revision, please contact SPIE Digital Library Customer Service for assistance.
© (2025) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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V. V. Yashchuk, K. Munechika, S. Rochester, P. Z. Takacs, I. Lacey, and K. Yamada "Performance of plane wavefront Fizeau interferometers in power spectral density measurements with tilted plane optics (Erratum)", Proc. SPIE 13150, Advances in X-Ray/EUV Optics and Components XIX, 131500E (7 January 2025); https://doi.org/10.1117/12.3060512
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KEYWORDS
Fizeau interferometers
Spectral density
Wavefronts
X-ray optics
Metrology
Optical engineering
Optical surfaces
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