Research on electromagnetic immunity testing method for brake systems based on intelligent algorithms

Yanan Sun; Jiajia Guo; Guiying Ren; Dongsheng Wang; Chong Wang; Mingli Zhao; Zilong Wang

doi:10.1117/12.3030141

5 June 2024 Research on electromagnetic immunity testing method for brake systems based on intelligent algorithms

Yanan Sun, Jiajia Guo, Guiying Ren, Dongsheng Wang, Chong Wang, Mingli Zhao, Zilong Wang

Proceedings Volume 13163, Fourth International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2024); 131633Y (2024) https://doi.org/10.1117/12.3030141
Event: International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2024), 2024, Xi'an, China

Abstract

The electromagnetic anti-interference test of the vehicle braking system is a mandatory testing item required by the national standard GB 21670-2008 Technical Requirements and Test Methods for Passenger Car Braking Systems. By simulating the scene of electromagnetic interference from the surrounding environment during the actual vehicle operation in a 10 meter semi anechoic chamber, the electromagnetic anti-interference performance of the tested vehicle braking system meets the requirements of the national standard. The brake system testing auxiliary equipment based on BP neural network adaptive PID algorithm and adaptive outlier removal method can solve the error problems caused by testing equipment failures, human factors, etc. in the existing experimental process, obtain real-time ABS working condition data of the automotive brake system, and achieve quantifiable, evaluable, and traceable test data.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Yanan Sun, Jiajia Guo, Guiying Ren, Dongsheng Wang, Chong Wang, Mingli Zhao, and Zilong Wang "Research on electromagnetic immunity testing method for brake systems based on intelligent algorithms", Proc. SPIE 13163, Fourth International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2024), 131633Y (5 June 2024); https://doi.org/10.1117/12.3030141

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