Paper
5 December 2024 Research on the sources of contaminants in clean laser systems and their impact on the performance of dielectric film reflectors
Author Affiliations +
Proceedings Volume 13418, Fifteenth International Conference on Information Optics and Photonics (CIOP 2024); 134181M (2024) https://doi.org/10.1117/12.3048485
Event: 15th International Conference on Information Optics and Photonics (CIOP2024), 2024, Xi’an, China
Abstract
As a key component in the laser system, contamination damage to the multilayer dielectric film reflector significantly limits the safe operation of the laser system. Stray light irradiation of the system on the metal structural components produced by the sputtering material is the main source of reflector surface contaminants. Mastery of stray light-induced contaminants behavior is essential for solving the problem of reflector contamination damage. In this study, the real process of sputtering contaminants induced by stray light irradiation of aluminum alloy in sealed chambers is experimentally simulated. The morphological characteristics, composition, and distribution pattern of the contaminants deposited on the reflector surface were analyzed. The influence of various types of contaminants on the damage performance of the reflector was investigated. Scanning electron microscopy measurements showed that the presence of carbonaceous organic contaminants and metallic aluminum particles on the surface of the samples resulted in localized bonding behavior. One-to-one damage threshold measurements showed that the composite contaminants severely degraded the performance of the reflector. These results fundamentally explain the source and physicochemical properties of the contaminants on the reflector surface in the laser system, reveal the mechanism of stray light-induced contaminants on the damage performance of the multilayer dielectric film reflector, and provide a theoretical basis for the clean debugging of the sealing cavities and the design of enhanced stray light irradiation resistance of the aluminum alloy materials.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Fei Wang, Qiang Yuan, Yuhai Li, Laixi Sun, Xiaodong Yuan, and Peng Zhang "Research on the sources of contaminants in clean laser systems and their impact on the performance of dielectric film reflectors", Proc. SPIE 13418, Fifteenth International Conference on Information Optics and Photonics (CIOP 2024), 134181M (5 December 2024); https://doi.org/10.1117/12.3048485
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KEYWORDS
Contamination

Reflectors

Aluminum

Alloys

Laser irradiation

Dielectrics

Laser systems engineering

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