Power distribution from insertion device x-ray sources

P. James Viccaro

doi:10.1117/12.23298

1 January 1991 Power distribution from insertion device x-ray sources

P. James Viccaro

Proceedings Volume 1345, Advanced X-Ray/EUV Radiation Sources and Applications; (1991) https://doi.org/10.1117/12.23298
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

Insertion device (ID) synchrotron x-ray sources on present day and next-generation synchrotron facilities have very attractive spectral properties. In addition however they are capable of producing x-ray beams with large powers and in some cases unprecedented power densities. An overview of the spatial and frequency distributions of these sources including the effects of synchrotron particle beam emittance is presented. 1.

Citation Download Citation

P. James Viccaro "Power distribution from insertion device x-ray sources", Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, (1 January 1991); https://doi.org/10.1117/12.23298

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