Time of flight mass spectrometry of the laser produced fragments

Sergey Sergeivich Alimpiev; Sergey M. Nikiforov; A. K. Dudojan; V. Y. Shevtshenko

doi:10.1117/12.23705

1 October 1990 Time of flight mass spectrometry of the laser produced fragments

Sergey Sergeivich Alimpiev, Sergey M. Nikiforov, A. K. Dudojan, V. Y. Shevtshenko

Proceedings Volume 1352, 1st Intl School on Laser Surface Microprocessing; (1990) https://doi.org/10.1117/12.23705
Event: International School on Laser Surface Microprocessing, 1989, Tashkent, Uzbekistan

Abstract

The application of reflectron time of flight mass spectrometry or analyzing the products of laser induced thin films modification and YBa2 Cu3 0 _ in bulk ablat ion is discussed . The measurements of threshol Xlaser fluences and fragment velocity distribution are presented.

Citation Download Citation

Sergey Sergeivich Alimpiev, Sergey M. Nikiforov, A. K. Dudojan, and V. Y. Shevtshenko "Time of flight mass spectrometry of the laser produced fragments", Proc. SPIE 1352, 1st Intl School on Laser Surface Microprocessing, (1 October 1990); https://doi.org/10.1117/12.23705

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available