3-D moire contouring with modified CCD-camera

M. Seib; Heinrich A. Hoefler

doi:10.1117/12.35029

1 October 1990 3-D moire contouring with modified CCD-camera

M. Seib, Heinrich A. Hoefler

Proceedings Volume 1375, ICALEO '89: Optical Sensing and Measurement; (1990) https://doi.org/10.1117/12.35029
Event: ICALEO89, 1989, Orlando, FL, United States

Abstract

A new type of moire reference grid on the surface of a CCD-chip is presented. In surface contouring an improvement of the resolution by a factor of 4 is achieved. The modification steps to generate the new reference grid are simple. Any further modification of the internal image size or the electronic design of the CCD-camera is not necessary.

Citation Download Citation

M. Seib and Heinrich A. Hoefler "3-D moire contouring with modified CCD-camera", Proc. SPIE 1375, ICALEO '89: Optical Sensing and Measurement, (1 October 1990); https://doi.org/10.1117/12.35029

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