Technique for measuring stress-induced birefringence

Jeffrey R. Heidel; Mark S. Zediker

doi:10.1117/12.43809

1 July 1991 Technique for measuring stress-induced birefringence

Jeffrey R. Heidel, Mark S. Zediker

Proceedings Volume 1418, Laser Diode Technology and Applications III; (1991) https://doi.org/10.1117/12.43809
Event: Optics, Electro-Optics, and Laser Applications in Science and Engineering, 1991, Los Angeles, CA, United States

Abstract

A technique has been developed to generate an image of the stress-induced birefringence which occurs in AlGaAs/GaAs ridge waveguides. Cross-sections of this image can be taken to yield quantitative results. A preliminary cross-sectional plot from a ridge waveguide shows that the birefringence is higher at the ridge edges due to stress caused by the waveguide structure, and agrees with the shape predicted by theory.

Citation Download Citation

Jeffrey R. Heidel and Mark S. Zediker "Technique for measuring stress-induced birefringence", Proc. SPIE 1418, Laser Diode Technology and Applications III, (1 July 1991); https://doi.org/10.1117/12.43809

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