Dynamic studies of crystal growth using the AFM

Andrew J. Gratz; Paul E. Hillner; Srinivas Manne; Paul K. Hansma

doi:10.1117/12.58185

1 May 1992 Dynamic studies of crystal growth using the AFM

Andrew J. Gratz, Paul E. Hillner, Srinivas Manne, Paul K. Hansma

Proceedings Volume 1639, Scanning Probe Microscopies; (1992) https://doi.org/10.1117/12.58185
Event: OE/LASE '92, 1992, Los Angeles, CA, United States

Abstract

Recent advances in AFM technology allow direct observation of solution growth and dissolution (etching) processes important in industry and nature, and direct tests of crystal growth models. We present results of studies of calcite and quartz, including real-time, in situ observations. While both crystals experience layer growth/dissolution, calcite grows by direct addition of material to growth steps without an important contribution from surface diffusion; quartz surfaces are consistent with more traditional, BCF-type growth models. Dynamic AFM observations of growth processes may allow optimization of industrial systems.

Citation Download Citation

Andrew J. Gratz, Paul E. Hillner, Srinivas Manne, and Paul K. Hansma "Dynamic studies of crystal growth using the AFM", Proc. SPIE 1639, Scanning Probe Microscopies, (1 May 1992); https://doi.org/10.1117/12.58185

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