Diode laser spectrometer for line profile measurements

V. G. Avetisov; Alexander I. Nadezhdinskii; Amir N. Khusnutdinov; Patimat M. Omarova; Mikhail V. Zyrianov

doi:10.1117/12.58672

1 April 1992 Diode laser spectrometer for line profile measurements

V. G. Avetisov, Alexander I. Nadezhdinskii, Amir N. Khusnutdinov, Patimat M. Omarova, Mikhail V. Zyrianov

Proceedings Volume 1724, Tunable Diode Laser Applications; (1992) https://doi.org/10.1117/12.58672
Event: Tunable Diode Laser Applications, 1993, Moscow, Russian Federation

Abstract

A diode laser spectrometer has been used for high accuracy line profile measurements in the 1.7-2.4 micron region. Measured lineshapes have been least-squares fitted by Voigt profile with flating Gaussian component. Gaussian component pressure dependence resulting from the Dicke narrowing effect is observed. Line intensities, self-induced broadenings, and shifts of five water vapor lines near 5475/cm are also presented.

Citation Download Citation

V. G. Avetisov, Alexander I. Nadezhdinskii, Amir N. Khusnutdinov, Patimat M. Omarova, and Mikhail V. Zyrianov "Diode laser spectrometer for line profile measurements", Proc. SPIE 1724, Tunable Diode Laser Applications, (1 April 1992); https://doi.org/10.1117/12.58672

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