Model matching using multiple data sources

Guanghua Zhang; E. Thirion; Andrew M. Wallace

doi:10.1117/12.144800

6 May 1993 Model matching using multiple data sources

Guanghua Zhang, E. Thirion, Andrew M. Wallace

Proceedings Volume 1907, Machine Vision Applications in Industrial Inspection; (1993) https://doi.org/10.1117/12.144800
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1993, San Jose, CA, United States

Abstract

We describe an industrial inspection system with multiple data sources for object location and inspection. Within the context of this system, we present an approach for extraction of reliable and full object features consisting of both surfaces and space curves from registered range and intensity data. For matching, a homogeneous representation is adopted, which is applicable to a wide classes of object features. However, initial results are demonstrated on line and plane data only.

Citation Download Citation

Guanghua Zhang, E. Thirion, and Andrew M. Wallace "Model matching using multiple data sources", Proc. SPIE 1907, Machine Vision Applications in Industrial Inspection, (6 May 1993); https://doi.org/10.1117/12.144800

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