Paper
8 August 1993 Rim phase-shift mask combined with off-axis illumination: a path to .5Λ/NA geometries
Author Affiliations +
Abstract
Phase Shift Mask (PSM) approaches may be classified as either strong or weak. This paper addresses weak PSM approaches which are attractive because of their universal applicability to any pattern. A simple design algorithm for rim PSM, called Biased Rim Design (BiRD), is described. When used with normal stepper illumination ((sigma) equals .5), the modest benefits of rim PSM are of questionable value in many cases. However, theoretical considerations show a synergy of weak PSM combined with off-axis illumination. One specific combination termed BiRD/QUEST, is explored through a series of simulations. These results suggest that a properly biased weak PSM with appropriate illumination allows robust manufacturing of 0.5 (lambda) /NA lithographic patterns.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Timothy A. Brunner "Rim phase-shift mask combined with off-axis illumination: a path to .5Λ/NA geometries", Proc. SPIE 1927, Optical/Laser Microlithography, (8 August 1993); https://doi.org/10.1117/12.150474
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CITATIONS
Cited by 5 scholarly publications and 5 patents.
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KEYWORDS
Photomasks

Phase shifts

Optical lithography

Lithography

Spatial frequencies

Computer aided design

Lithographic illumination

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