Paper
22 September 1993 Surface roughness measurement by image processing method
Shou-Bin Liu, Hui-Fen Yu
Author Affiliations +
Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156407
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
Various methods for measuring surface roughness as well as their limitations were analysed in this paper, A new method using image processing to measure surface roughness was proposed. A surface roughness measurement system was designed with a light-sectioning microscope and the corresponding software was developed. Non- contact and multiparameter measurement of surface roughness has been realised. Experimental results show that the method was feasible. The method of measuring surface roughness by image processing is significant for developing a non- contact, multiparameter and intelligent instrument of surface roughness.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shou-Bin Liu and Hui-Fen Yu "Surface roughness measurement by image processing method", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); https://doi.org/10.1117/12.156407
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Cited by 1 scholarly publication.
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KEYWORDS
Surface roughness

Image processing

Digital imaging

Edge detection

Image sensors

Microscopes

Edge roughness

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