Open test and measurement systems application in holography and optics

Yury V. Demchenko; Mikhael M. Semerenko

doi:10.1117/12.165433

10 December 1993 Open test and measurement systems application in holography and optics

Yury V. Demchenko, Mikhael M. Semerenko

Proceedings Volume 2108, International Conference on Holography, Correlation Optics, and Recording Materials; (1993) https://doi.org/10.1117/12.165433
Event: Holography, Correlation Optics, and Recording Materials, 1993, Chernivsti, Ukraine

Abstract

The Open Test and Measurement Systems (OTMS) conception and generalized OTMS model are discussed in this paper. The following levels are defined in the model: object, physical, data, application, and manufacturing. VXIbus based OTMS realization and its benefits are discussed concerning applications for integral optics and golography.

Citation Download Citation

Yury V. Demchenko and Mikhael M. Semerenko "Open test and measurement systems application in holography and optics", Proc. SPIE 2108, International Conference on Holography, Correlation Optics, and Recording Materials, (10 December 1993); https://doi.org/10.1117/12.165433

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