Paper
29 June 1994 Bi-2223/Bi-2234 superlattice: its structural analysis and superconducting transition temperature
Takeshi Hatano, Kazuo Kadowaki, Keikichi G. Nakamura
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Abstract
(2223)2/(2234)2 superlattices have been synthesized by three target sequential sputter deposition of BiO, SrCu0.5O1.5 and CaCuO2 layers. The superstructure formed was analyzed in atomic layer scale by using some X-ray diffraction technique, such as interference of X-ray specular reflection, observation of the Laue's function pattern and a quantitative analysis of intergrowth. The superlattice, thus confirmed in the atomic layer scale, has a superconducting transition temperature (Tc) as high as the average of monophasic 2223 and 2234 films. The resistivity showed a similar angular dependence on the magnetic field orientation even at the temperature higher than the Tc of 2234. These results will be discussed by the hole diffusion and/or the proximity effect between the 2223 and 2234 layers.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Takeshi Hatano, Kazuo Kadowaki, and Keikichi G. Nakamura "Bi-2223/Bi-2234 superlattice: its structural analysis and superconducting transition temperature", Proc. SPIE 2157, Superconducting Superlattices and Multilayers, (29 June 1994); https://doi.org/10.1117/12.179173
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KEYWORDS
X-ray diffraction

Superconductors

X-rays

Superlattices

Diffraction

Sputter deposition

Magnetism

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