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13 July 1994 X-ray photoelectron spectroscopy (XPS) studies on Zn/Cd selenide thin films grown by electron-beam deposition
D. R. Rao, R. Islam
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Proceedings Volume 2228, Producibility of II-VI Materials and Devices; (1994) https://doi.org/10.1117/12.179657
Event: SPIE's International Symposium on Optical Engineering and Photonics in Aerospace Sensing, 1994, Orlando, FL, United States
Abstract
Zn1 Cd Se ternary thin films were deposited by electron beam evaporation and their c~iition was examined using X-ray photoelectron spectroscopy (XPS). They all indicated a general selenium deficiency. The Auger parameter (~ ) and ionicity (f.) have been estimated fran XPS data. The variat:i.on of d hetween the different c~sitions is not very significant. The f. values are 0.650, 0.680 for 7.nSe and C"..d.Se films respectively.
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D. R. Rao and R. Islam "X-ray photoelectron spectroscopy (XPS) studies on Zn/Cd selenide thin films grown by electron-beam deposition", Proc. SPIE 2228, Producibility of II-VI Materials and Devices, (13 July 1994); https://doi.org/10.1117/12.179657
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KEYWORDS
Photoemission spectroscopy
Thin film growth
Thin films
X-rays
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