Paper
5 August 1994 Response time of photoemission of thin film with different surface potential barriers
JinLei Wu, Ling-jian Guo, Q. D. Wu
Author Affiliations +
Proceedings Volume 2321, Second International Conference on Optoelectronic Science and Engineering '94; (1994) https://doi.org/10.1117/12.182018
Event: Optoelectronic Science and Engineering '94: International Conference, 1994, Beijing, China
Abstract
The response time of photoemissive materials is required for detecting ultrashort duration laser pulses. The photoelectron's response time will increase with increasing energy of photons. If the surface potential barrier of thin film declines, the photoemissive sensitivity or quantum yield will rise, however the response time will also increase which means that response time characteristic gets worse. As an example, the response time for Ag-O-Ca thin film is calculated.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
JinLei Wu, Ling-jian Guo, and Q. D. Wu "Response time of photoemission of thin film with different surface potential barriers", Proc. SPIE 2321, Second International Conference on Optoelectronic Science and Engineering '94, (5 August 1994); https://doi.org/10.1117/12.182018
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Cited by 2 scholarly publications.
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