CTE model for estimating CCD image smear

James S. Flores

doi:10.1117/12.218646

8 September 1995 CTE model for estimating CCD image smear

James S. Flores

Proceedings Volume 2551, Photoelectronic Detectors, Cameras, and Systems; (1995) https://doi.org/10.1117/12.218646
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

Radiation promotes charge transfer inefficiency (CTI) in a CCD, causing focused images to become smeared. For example, such smearing will degrade the accuracy and precision of a CCD-based pointing system. A model has been created whereby CTI smearing caused by a radiation induced traps can be projected, given the spatial distribution and pixel position of the image, the large signal CTI, temperature, parallel and serial transfer frequencies. It is well known that CTI increases with signal size to some asymptotic level, and the model description offers a theory and function for this behavior. The final product indicates several complicating factors affecting CTI evaluation which could inflate results, and make precise comparisons between experiments.

Citation Download Citation

James S. Flores "CTE model for estimating CCD image smear", Proc. SPIE 2551, Photoelectronic Detectors, Cameras, and Systems, (8 September 1995); https://doi.org/10.1117/12.218646

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available