Paper
10 June 1996 Probing the local structure of high-Tc superconductors using XAFS spectroscopy
Frank Bridges, C. H. Booth, Guoguang Li, E. D. Bauer, James B. Boyce, Tord Claeson
Author Affiliations +
Abstract
X-ray absorption fine-structure (XAFS) is a local structural probe that is complementary to diffraction techniques. We discuss the types of information that can be obtained using this probe and then consider several examples, including the distortion about Co in YBa2Cu3O7 (YBCO), an unusual negative correlation of atom pair displacements in HgBa2CuO4+(delta ), and the distortions about the O(4) atom in thin films and single crystals of YBCO.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Frank Bridges, C. H. Booth, Guoguang Li, E. D. Bauer, James B. Boyce, and Tord Claeson "Probing the local structure of high-Tc superconductors using XAFS spectroscopy", Proc. SPIE 2696, Spectroscopic Studies of Superconductors, (10 June 1996); https://doi.org/10.1117/12.241785
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KEYWORDS
Chemical species

Distortion

Crystals

Thin films

Diffraction

Polarization

Polarons

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