Optoelectronic sampler: modeling and characterization

Lydie Armengaud; Michele Lalande; Nicolas Breuil; Bernard Jecko; Anne Ghis; Marc Cuzin; Maurice Nail; Phillipe Gilbert

doi:10.1117/12.262758

18 December 1996 Optoelectronic sampler: modeling and characterization

Lydie Armengaud, Michele Lalande, Nicolas Breuil, Bernard Jecko, Anne Ghis, Marc Cuzin, Maurice Nail, Phillipe Gilbert

Proceedings Volume 2842, Millimeter and Submillimeter Waves and Applications III; (1996) https://doi.org/10.1117/12.262758
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

In this paper, an optoelectronic sampler is described. The device is made with microstrip propagation lines and ultra- rapid photoconductive switches which are integrated in the same substrate. The sampler is used to measure the output electrical signal provided by an ultra-fast detector. The detector electrical pulse lasts from 20 ps to 100 ps and is sampled every 4 ps. The total record length is 400 ps.

Citation Download Citation

Lydie Armengaud, Michele Lalande, Nicolas Breuil, Bernard Jecko, Anne Ghis, Marc Cuzin, Maurice Nail, and Phillipe Gilbert "Optoelectronic sampler: modeling and characterization", Proc. SPIE 2842, Millimeter and Submillimeter Waves and Applications III, (18 December 1996); https://doi.org/10.1117/12.262758

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