Paper
22 November 1996 Bent crystal analyzer without grooves for inelastic scattering: first experimental results
Vladimir I. Kushnir, Albert T. Macrander
Author Affiliations +
Abstract
A new design of a bent crystal analyzer for high energy resolution inelastic X-ray scattering has been recently proposed. It has been theoretically predicted that an analyzer with reflecting planes at a certain angle with respect to a crystal surface, bent with two different radii of curvature, will have the same energy resolution as a perfect crystal. The first experimental measurement obtained at the Advanced Photon Source of a bandwidth of such an analyzer is presented. The overall energy resolution of the analyzer and monochromator observed with a narrow beam is equal to 16.4 meV (FWHM) at 13.84 KeV.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladimir I. Kushnir and Albert T. Macrander "Bent crystal analyzer without grooves for inelastic scattering: first experimental results", Proc. SPIE 2856, Optics for High-Brightness Synchrotron Radiation Beamlines II, (22 November 1996); https://doi.org/10.1117/12.259869
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KEYWORDS
Crystals

Laser crystals

Monochromators

Scattering

Diffraction

Silicon

X-rays

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