Optical design for a breadboard high-resolution spectrometer for SIRTF/IRS

Robert J. Brown; James R. Houck; Jeffrey E. Van Cleve

doi:10.1117/12.256226

1 November 1996 Optical design for a breadboard high-resolution spectrometer for SIRTF/IRS

Robert J. Brown, James R. Houck, Jeffrey E. Van Cleve

Proceedings Volume 2863, Current Developments in Optical Design and Engineering VI; (1996) https://doi.org/10.1117/12.256226
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

The optical design of a breadboard high resolution infrared spectrometer for the IRS instrument on the SIRTF mission is discussed. The spectrometer uses a crossed echelle grating configuration to cover the spectral region from 10 to 20 micrometer with a resolving power of approximately equals 600. The all reflective spectrometer forms a nearly diffraction limited image of the two dimensional spectrum on a 128 multiplied by 128 arsenic doped silicon area array with 75 micrometer pixels. The design aspects discussed include, grating numerology, image quality, packaging and alignment philosophy.

Citation Download Citation

Robert J. Brown, James R. Houck, and Jeffrey E. Van Cleve "Optical design for a breadboard high-resolution spectrometer for SIRTF/IRS", Proc. SPIE 2863, Current Developments in Optical Design and Engineering VI, (1 November 1996); https://doi.org/10.1117/12.256226

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