Laser range-finding: global characterization of the optical head and implementation of measurement methods

Gaelle Bazin; Bernard A. Journet

doi:10.1117/12.263317

20 January 1997 Laser range-finding: global characterization of the optical head and implementation of measurement methods

Gaelle Bazin, Bernard A. Journet

Author Affiliations +

Proceedings Volume 2909, Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II; (1997) https://doi.org/10.1117/12.263317
Event: Photonics East '96, 1996, Boston, MA, United States

Abstract

Whatever laser range-finding technique is used, the operation principle is based on optical information coding and transmission. Indeed, the optical head represents the common point within the whole of telemetric methods. So, its precise characterization presents a major interest. The emission part is performed by a laser diode and the reception by an avalanche photodiode coupled with filtering and RF amplification. The optical path is along coaxial alignment if an appropriate geometry is chosen. The whole systems may be considered as a quadriple with the emitter as the input and the receptor as the output. Therefore, the network analyzer is particularly adapted to a global study of such a quadripole. With a measurement protocol, the performances of the optical head can be then evaluated in terms of optical and electronic properties. Nevertheless, according to the great variety of angles to be measured, many range-finding methods can be used, as the frequency modulated continuous wave (FMCW) radar ranging method, the phase-shift measurements, either with heterodyne method or direct synchronous detection. Whereas two of these, the FMCW or the heterodyne phase detection, have already been developed in our laboratory, we only introduce as a new method the synchronous detection.

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Gaelle Bazin and Bernard A. Journet "Laser range-finding: global characterization of the optical head and implementation of measurement methods", Proc. SPIE 2909, Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II, (20 January 1997); https://doi.org/10.1117/12.263317

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