New phase evaluation methods using electronic speckle pattern interferometry for deformation analysis

Rini Widiastuti; Sanichiro John Yoshida; - Suprapedi; A. Kusnowo; M. H. br Pardede; - Rukita; S. Siahaan

doi:10.1117/12.269794

20 March 1997 New phase evaluation methods using electronic speckle pattern interferometry for deformation analysis

Rini Widiastuti, Sanichiro John Yoshida, - Suprapedi, A. Kusnowo, M. H. br Pardede, - Rukita, S. Siahaan

Proceedings Volume 2921, International Conference on Experimental Mechanics: Advances and Applications; (1997) https://doi.org/10.1117/12.269794
Event: International Conference on Experimental Mechanics: Advances and Applications, 1996, Singapore, Singapore

Abstract

New methods of deformation analysis using electronic speckle pattern interferometry is proposed. The advantages of the measurement system are its capability to evaluate the phase data embedded in fringe pattern continuously, by simply taking speckle images and doing simple arithmetic operation on data processing stage. The methods can be applied for deformation analysis and fracture prediction technique on a loaded material. Analysis of fracture was done based on mesomechanics theory proposed by V. E. Panin. The important strength of this system is the ability of predicting a future crack on a loaded material by performing non contact and non destructive measurement system.

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Rini Widiastuti, Sanichiro John Yoshida, - Suprapedi, A. Kusnowo, M. H. br Pardede, - Rukita, and S. Siahaan "New phase evaluation methods using electronic speckle pattern interferometry for deformation analysis", Proc. SPIE 2921, International Conference on Experimental Mechanics: Advances and Applications, (20 March 1997); https://doi.org/10.1117/12.269794

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KEYWORDS

Interferometry

Speckle pattern

Fringe analysis

Speckle

Interferometers

Data processing

Phase shifts

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