Paper
15 April 1997 Efficient image-processing method in 3D vision inspection
Huicheng Zhou, Jihong Chen, Yang Daoshan, Shawn Buckley
Author Affiliations +
Abstract
A geometric model-driven strategy for measuring an object's dimensions in three dimensions using image processing is discussed. A laser range scanner is used to collected 3D data points from the scene. By constructing a geometric model from a CAD data base or from a sample object during the setup phase, an inspection index is established according to the user's inspection requirements. Useful information about the object is recorded in the inspection index to guide image processing during the later inspection phase when many similar objects are measured. The inspection index is generated off-line by analyzing the object's geometric features, their relationships with dimensions and other attributes. Examples of the inspection index as well as experimental results of rapid, on-line measuring is presented.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Huicheng Zhou, Jihong Chen, Yang Daoshan, and Shawn Buckley "Efficient image-processing method in 3D vision inspection", Proc. SPIE 3029, Machine Vision Applications in Industrial Inspection V, (15 April 1997); https://doi.org/10.1117/12.271239
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Inspection

3D image processing

Image processing

3D modeling

Cameras

Sensors

Data modeling

RELATED CONTENT

Automated sea floor extraction from underwater video
Proceedings of SPIE (May 17 2016)
Inspection of free-form surfaces using dense range data
Proceedings of SPIE (November 23 1994)
Vision system for telerobotics operation
Proceedings of SPIE (October 01 1992)
Robot Guidance Using A Morphological Vision Algorithm
Proceedings of SPIE (December 11 1985)
Intelligent approaches in image analysis
Proceedings of SPIE (June 30 1998)
A method for image matching based on epipolar geometry
Proceedings of SPIE (March 05 2008)

Back to Top