Design of optical thin film structures for information recording based on spectrophotometric data

A. D. Leonets; D. A. Grinko

doi:10.1117/12.267709

28 February 1997 Design of optical thin film structures for information recording based on spectrophotometric data

A. D. Leonets, D. A. Grinko

Proceedings Volume 3055, International Conference on Optical Storage, Imaging, and Transmission of Information; (1997) https://doi.org/10.1117/12.267709
Event: International Conference on Optical Storage, 1996, Kiev, Ukraine

Abstract

The work describes a method of determination of complex refractive index spectra of thin films and computation modeling of optical properties of multilayer recording media. The examples of inorganic films spectra are given, the comparison of results of modeling with an experiment is conducted. The installation, enabling to conduct spectrophotometric measurements of light-sensitive recording materials in weak monochromatic flows, excluding changes of material during measurement is described.

Citation Download Citation

A. D. Leonets and D. A. Grinko "Design of optical thin film structures for information recording based on spectrophotometric data", Proc. SPIE 3055, International Conference on Optical Storage, Imaging, and Transmission of Information, (28 February 1997); https://doi.org/10.1117/12.267709

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