Paper
3 March 1997 Line broadening and band profile of CO2 in helium at 193 K
J. Boissoles, F. Thibault, B. Khalil, Ch. Boulet
Author Affiliations +
Proceedings Volume 3090, 12th Symposium and School on High-Resolution Molecular Spectroscopy; (1997) https://doi.org/10.1117/12.267781
Event: 12th Symposium and School on High Resolution Molecular Spectroscopy, 1996, St. Petersburg, Russian Federation
Abstract
In order to investigate the temperature dependence of broadening parameters and band profiles we have studied the v2 and 3v3 bands of carbon-dioxide perturbed by He at 193 K. We used the energy corrected sudden (ECS) scaling law associated with the power fitting law. Experiments were carried out with a Fourier transform spectrometer.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Boissoles, F. Thibault, B. Khalil, and Ch. Boulet "Line broadening and band profile of CO2 in helium at 193 K", Proc. SPIE 3090, 12th Symposium and School on High-Resolution Molecular Spectroscopy, (3 March 1997); https://doi.org/10.1117/12.267781
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KEYWORDS
Carbon dioxide

Helium

Absorption

Fourier transforms

Spectroscopy

Laser applications

Liquids

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