Null-polarimetric studies of waveplate parameters

Oleg S. Kushnir; Orest G. Vlokh

doi:10.1117/12.271807

1 April 1997 Null-polarimetric studies of waveplate parameters

Oleg S. Kushnir, Orest G. Vlokh

Proceedings Volume 3094, Polarimetry and Ellipsometry; (1997) https://doi.org/10.1117/12.271807
Event: Polarimetry and Ellipsometry, 1996, Kazimierz Dolny, Poland

Abstract

A polarimetric technique for studying the parameters of the waveplates is developed. It uses dependencies of the polarization azimuth and ellipticity of the light emergent from the waveplate on the azimuth of linearly polarized incident light. When the latter azimuth is sufficiently small, the dependencies become linear, their slopes being dependent on the phase retardation of the crystal plate. This allows to test the waveplates with a high accuracy. Relevant results obtained for a number of quartz and mica quarter-wave retarders are presented. The technique is compared with the other methods known in the literature.

Citation Download Citation

Oleg S. Kushnir and Orest G. Vlokh "Null-polarimetric studies of waveplate parameters", Proc. SPIE 3094, Polarimetry and Ellipsometry, (1 April 1997); https://doi.org/10.1117/12.271807

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