Paper
1 January 1998 Nonlinear optical properties of two types of PIC J-aggregates in thin films
Roman V. Markov, Alexander I. Plekhanov, Sergei G. Rautian, Natalja A. Orlova, Vladimir V. Shelkovnikov, Vladimir V. Volkov
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Abstract
Optical properties of molecular J-aggregates of cyanine dyes are investigated intensively at present time. The most characteristic peculiarity of J-aggregates is presence of narrow peak (J-peak) red shifted from the peak of single molecule in absorption spectrum. J-peak is due to exciton absorption (Frenkel's exciton) and its width is defined by effect of motional narrowing) The interest to J-aggregates of pseudoisocyanine (PlC) has been aroused recently by discovery of their huge cubic susceptibility with l)iCOSecOnd decay time.24 The developing of preparation methods for J-aggregates PIG in thin films is actual for practical application. J-aggregates PlC in films of Langmuir-Blodgett or in a polymer matrix have been described recently.58 Temperature and radiation stability of such films allows to carry out investigations of structure, exciton dynamics and their nonlinear-optical properties. One of the methods for study of nonlinear properties of thin films is z-scan technique when real and imaginary parts of third order susceptibility are measured independently . Nonlinear optical properties of two types of i-aggregates prepared in thin films and studied by z-scan technique are described in this paper.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Roman V. Markov, Alexander I. Plekhanov, Sergei G. Rautian, Natalja A. Orlova, Vladimir V. Shelkovnikov, and Vladimir V. Volkov "Nonlinear optical properties of two types of PIC J-aggregates in thin films", Proc. SPIE 3347, Optical Information Science and Technology (OIST97): Optical Recording Mechanisms and Media, (1 January 1998); https://doi.org/10.1117/12.301407
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KEYWORDS
Absorption

Photonic integrated circuits

Excitons

Thin films

Data modeling

Refraction

Information operations

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