Proposed Figures Of Merit For Staring Focal Planes

W. B. Birtley

doi:10.1117/12.933749

28 December 1982 Proposed Figures Of Merit For Staring Focal Planes

W. B. Birtley

Proceedings Volume 0344, Infrared Sensor Technology; (1982) https://doi.org/10.1117/12.933749
Event: 1982 Technical Symposium East, 1982, Arlington, United States

Abstract

This work reflects the methodology used at Rockwell International in the radiometric evaluation of IR/CCD focal plane elements. It is intended as an input which, when combined with inputs from other industrial and government groups, will result in standardized procedures for the evaluation of detector/charge-coupled devices similar to the procedures prepared by DOD for the evaluation of infrared detectors. Specifically, data collection, data reduction, and data formats are discussed, as well as proposed figures of merit for quantum yield and device noise.

Citation Download Citation

W. B. Birtley "Proposed Figures Of Merit For Staring Focal Planes", Proc. SPIE 0344, Infrared Sensor Technology, (28 December 1982); https://doi.org/10.1117/12.933749

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