Physical properties and evaluation of spectrometer-grade CdSe single crystals

Henry Chen; M. Hayes; X. Ma; Ying-Fang Chen; Stephen U. Egarievwe; Jean-Olivier Ndap; Kaushik Chattopadhyay; Arnold Burger; Jon R. Leist

doi:10.1117/12.312895

1 July 1998 Physical properties and evaluation of spectrometer-grade CdSe single crystals

Henry Chen, M. Hayes, X. Ma, Ying-Fang Chen, Stephen U. Egarievwe, Jean-Olivier Ndap, Kaushik Chattopadhyay, Arnold Burger, Jon R. Leist

Author Affiliations +

Proceedings Volume 3446, Hard X-Ray and Gamma-Ray Detector Physics and Applications; (1998) https://doi.org/10.1117/12.312895
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

Undoped CdSe single crystals were investigated by current- voltage measurement and low temperature photoluminescence. Crystal quality and surface morphology were also studied by optical microscopy and scanning electron microscopy. Together with gamma spectroscopy, the results show that the CdSe crystals have high resistivities in the 10¹⁰ (Omega) (DOT)cm range. This indicates their usefulness for room temperature nuclear radiation detection. Small active volume CdSe detector were fabricated and their performance is presented. A comparison of fundamental material properties between CdSe and CdZnTe detectors is also given.

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Henry Chen, M. Hayes, X. Ma, Ying-Fang Chen, Stephen U. Egarievwe, Jean-Olivier Ndap, Kaushik Chattopadhyay, Arnold Burger, and Jon R. Leist "Physical properties and evaluation of spectrometer-grade CdSe single crystals", Proc. SPIE 3446, Hard X-Ray and Gamma-Ray Detector Physics and Applications, (1 July 1998); https://doi.org/10.1117/12.312895

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