Morphological measurement of surface roughness

Yoganand Balagurunathan; Edward R. Dougherty

doi:10.1117/12.326949

6 October 1998 Morphological measurement of surface roughness

Yoganand Balagurunathan, Edward R. Dougherty

Proceedings Volume 3521, Machine Vision Systems for Inspection and Metrology VII; (1998) https://doi.org/10.1117/12.326949
Event: Photonics East (ISAM, VVDC, IEMB), 1998, Boston, MA, United States

Abstract

Morphological granulometric moments have proven useful for quantification and classification of image texture. This paper considers their use as measures of surface roughness. The analysis is based on simulations in the framework of a modified Boolean random function model for surfaces. Four granulometric features are considered: the pattern-spectrum mean and pattern-spectrum variance for both opening and closing granulometries generated by flat structuring elements. The expectations of these granulometric moments are compared with the expectations of the classical average and root-mean-square roughness across a range of Boolean models.

Citation Download Citation

Yoganand Balagurunathan and Edward R. Dougherty "Morphological measurement of surface roughness", Proc. SPIE 3521, Machine Vision Systems for Inspection and Metrology VII, (6 October 1998); https://doi.org/10.1117/12.326949

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available