Development of an optoelectronic instrument for detecting roundness of internal surface of artillery barrel

Ying Che; Yuzhi Shen; Jiong Liu

doi:10.1117/12.318381

10 August 1998 Development of an optoelectronic instrument for detecting roundness of internal surface of artillery barrel

Ying Che, Yuzhi Shen, Jiong Liu

Author Affiliations +

Proceedings Volume 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II; (1998) https://doi.org/10.1117/12.318381
Event: Photonics China '98, 1998, Beijing, China

Abstract

An optoelectronic detecting instrument is introduced, in which the charge-coupled device is used to detect the roundness of internal aperture in artillery barrel. In this paper, we expound the working principle and the design idea, and analyze the measuring error of it.

Citation Download Citation

Ying Che, Yuzhi Shen, and Jiong Liu "Development of an optoelectronic instrument for detecting roundness of internal surface of artillery barrel", Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); https://doi.org/10.1117/12.318381

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