Index of refraction modifications accompanying absorptive optical bistability in a semiconductor doped glass filter

F. Pereira; Michael Scott Belsley; J. Ribeira Salcedo

doi:10.1117/12.340059

28 January 1999 Index of refraction modifications accompanying absorptive optical bistability in a semiconductor doped glass filter

F. Pereira, Michael Scott Belsley, J. Ribeira Salcedo

Author Affiliations +

Proceedings Volume 3733, ICONO '98: Nonlinear Optical Phenomena and Coherent Optics in Information Technologies; (1999) https://doi.org/10.1117/12.340059
Event: ICONO '98: Laser Spectroscopy and Optical Diagnostics: Novel Trends and Applications in Laser Chemistry, Biophysics, and Biomedicine, 1998, Moscow, Russian Federation

Abstract

We have characterized the transverse spatial dependence of the real and imaginary parts of the complex nonlinear refractive index of a semiconductor doped glass filter, which exhibits absorptive bistability. Using the Z-scan technique, combined with an interferometric measurement of the integrated optical thickness, we are able to fit the observed experimental data assuming a quadratically varying transverse temperature profile in the sample. The transverse variations in the nonlinear refractive index do not scale directly with the size of the incident beam, but exhibit marked asymmetries depending on whether the incident beam is converging or diverging.

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F. Pereira, Michael Scott Belsley, and J. Ribeira Salcedo "Index of refraction modifications accompanying absorptive optical bistability in a semiconductor doped glass filter", Proc. SPIE 3733, ICONO '98: Nonlinear Optical Phenomena and Coherent Optics in Information Technologies, (28 January 1999); https://doi.org/10.1117/12.340059

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