Avalanche photodiode array sensor with high-speed CCD delay line readout

Kevin L. Albright; Jeffrey M. Bradley

doi:10.1117/12.366740

26 October 1999 Avalanche photodiode array sensor with high-speed CCD delay line readout

Kevin L. Albright, Jeffrey M. Bradley

Proceedings Volume 3794, Materials and Electronics for High-Speed and Infrared Detectors; (1999) https://doi.org/10.1117/12.366740
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

A prototype solid-state multi-chip-module (MCM) optical sensor circuit is described. The MCM is designed to sample the optical signals from a fiber-optic array at rates up to 200 MHz. The fiber-optic inputs interface to the MCM avalanche-photodiode (APD) sensor array. The prototype 40 pixel MCM stores approximately 1000 samples from each fiber before readout. This is done on the MCM using high-speed charge-injection input CCD delay line ICs. The MCM is designed to be cooled to 0 degrees C. This stabilizes the APD gain and minimizes dark current generation in the APD and the CCD delay line.

Citation Download Citation

Kevin L. Albright and Jeffrey M. Bradley "Avalanche photodiode array sensor with high-speed CCD delay line readout", Proc. SPIE 3794, Materials and Electronics for High-Speed and Infrared Detectors, (26 October 1999); https://doi.org/10.1117/12.366740

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available